Deep tissue temperature probe constructions

ABSTRACT

A disposable, zero-heat-flux, deep tissue temperature probe is constructed using a support assembly with multiple sections folded together or separated into strata during assembly of the probe. The sections support elements of the probe, including thermal sensors and a thermal resistor between the thermal sensors. Optionally, one of the sections supports a heater.

PRIORITY

This application claims priority to co-pending U.S. ProvisionalApplication for Patent 61/212,704 filed Apr. 15, 2009.

RELATED APPLICATION

This application contains material related to material disclosed,illustrated, and/or claimed in the following co-pending US patentapplications:

U.S. patent application Ser. No. 12/584,108, filed Aug. 31, 2009.

BACKGROUND

The subject matter relates to a temperature probe—a device placed on theskin of a subject to measure temperature. More particularly, the subjectmatter pertains to a deep tissue temperature (DTT) probe. Deep tissuetemperature measurement is a non-invasive determination of the coretemperature of a human body in which a probe is located over a region ofdeep tissue that is representative of the body core. The probe reads thetemperature of that region as the core temperature.

A system for non-invasively measuring deep tissue temperature wasdescribed by Fox and Solman in 1971 (Fox R H, Solman A J. A newtechnique for monitoring the deep body temperature in man from theintact skin surface. J. Physiol. January 1971:212(2): pp 8-10). Thesystem, illustrated in the schematic diagram of FIG. 1, estimates bodycore temperature by indirect means using a specially designed probe thatis placed upon the skin of a subject to stop or significantly neutralizeheat flow through a portion of the skin in order to measure temperature.The components of the probe 10 are contained in a housing 11. TheFox/Solman probe 10 includes two thermistors 20 mounted on either sideof a thermal resistance 22, which may be constituted of a layer ofinsulating material capable of supporting the thermistors 20. The probe10 also includes a heater 24 disposed at the top of the probe 10, overthe elements 20, 22, and 24. In use, the probe 10 is placed on a regionof the skin of a person whose deep tissue temperature is to be measured.With the bottom surface 26 of the probe resting on a person's body, incontact with the skin, the thermistors 20 measure a temperaturedifference, or error signal, across the thermal resistance 22. The errorsignal is used to drive a heater controller 30, which, in turn, operatesto minimize the error signal by causing the heater 24 to provide justenough heat to equalize the temperature on both sides of the thermalresistance 22. When the temperatures sensed by the thermistors 20 areequal or nearly so, there is no heat flow through the probe, and thetemperature measured by the lower thermistor 20 by way of a temperaturemeter circuit constituted of an amplifier 36 and a temperature meter 38is equivalent to DTT. The probe 10 essentially acts as a thermalinsulator that blocks heat flow through the thermal resistor 22; DTTprobes that operate in the same manner are termed “zero-heat-flux”(“ZHF”) probes. Since the heater 24 operates to guard against loss ofheat along the path of measurement through the probe, it is oftenreferred to as a “guard heater”.

Togawa improved the Fox/Solman design with a DTT probe structure thataccounted for the strong multi-dimensional heat transfer of dermal bloodflow through the skin. (Togawa T. Non-Invasive Deep Body TemperatureMeasurement. In: Rolfe P (ed) Non-Invasive Physiological Measurements.Vol. 1. 1979. Academic Press, London, pp. 261-277). The probe,illustrated in FIG. 2, encloses a ZHF sensor design 40, which blocksheat flow normal to the body, in a thick aluminum housing 42 with adisk-like construction that also reduces or eliminates radial heat flowfrom the center to the periphery of the probe.

ZHF deep tissue temperature measurement were improved in several ways,principally by decreasing the size and mass of a DTT probe to improveresponse and equilibrium times, and also by adding guard heating aroundthe periphery of the probe to minimize radial heat losses. Nevertheless,ZHF probes have typically been expensive and non-disposable, and havenot been widely adopted for clinical use, except for cardiac surgery inJapan. The sensors cannot be effectively heat sterilized, although theycan be disinfected with a cold bactericidal solution.

Presently, ZHF probes based on the original Fox and Solman designcomprise both software and hardware improvements. One such ZHF probe hasa stacked planar structure that consists of a number of discrete layers.An advantage of this design is a narrow width, which helps minimizeradial temperature differences from heat loss through the sides of thesensor. This probe includes an optimally-damped heater controller whichis operated by use of a PID (Proportional-Integral-Derivative) scheme tomaintain the heater temperature just slightly higher than thetemperature of the skin. The small temperature difference provides anerror signal for the controller. While the hardware design is notdisposable, it does provide some basic improvements to the size and massof the Fox/Solman and Togawa designs.

Maintenance of body core temperature in a normothermic range during aperioperative cycle has been shown to reduce the incidence of surgicalsite infection, and so it is beneficial to monitor a patient's body coretemperature before, during, and after surgery. Of course non-invasivemeasurement is very desirable, for both the comfort and the safety of apatient. Deep tissue temperature measurement using a probe supported onthe skin provides an accurate and non-invasive means for monitoring bodycore temperature. However, the size and mass of the Fox/Solman andTogawa probes do not promote disposability. Consequently, they must besterilized after each use, and stored for reuse. As a result, use ofthese probes to measure deep tissue temperature may raise the costsassociated with DTT measurement and may increase the risk of crosscontamination between patients. It is therefore useful to reduce thesize and mass of a DTT probe, without sacrificing its performance, so asto promote disposability.

SUMMARY OF THE INVENTION

Disposable, zero-heat-flux, deep tissue temperature probes areconstructed using a support assembly constituted of a flexible substratethat supports elements of the probe. The support assembly has multiplesections that may be folded together and/or separated to form amulti-level ZHF structure. The sections support elements of the probe,including thermal sensors separated by a layer of thermal resistanceinterposed between adjacent sensor-supporting sections. Preferably, atleast one of the sections supports a heater.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic block diagram of a deep tissue temperaturemeasurement system including a ZHF probe.

FIG. 2 is a schematic side sectional diagram of a second prior art deeptissue temperature measurement system including a ZHF deep tissuetemperature probe with an aluminum cap.

FIG. 3 illustrates a thermal measurement support assembly embodiment fora ZHF probe constituted of a film of material including two sectionsjoined by a hinge.

FIG. 4 illustrates the first embodiment with the two sections foldedtoward each other.

FIG. 5 illustrates the first embodiment with the two sections foldedtogether.

FIG. 6 is a drawing showing, in plan, a second thermal measurementsupport assembly embodiment for a ZHF probe constituted of a film ofmaterial including three sections joined by two hinges, in which thesections are opened and lie in the same plane with a first surface ofthe film visible.

FIG. 7 is a drawing showing, in plan, the film of material of FIG. 6, inwhich the sections are opened and lie in the same plane with secondsurface of the film visible.

FIG. 8 is a perspective drawing of the film of material showing how thethree sections are folded together.

FIG. 9 is a drawing showing, in plan, the top side of an assembled DTTprobe with the second support assembly embodiment. The figure includes atable illustrating assignment of pins of the probe.

FIG. 10 is a sectional view in elevation showing the assembled DTT probewith the second support assembly embodiment.

FIGS. 11A and 11B are plan and side views of a third support assemblyembodiment.

FIGS. 12A and 12B are plan and side views of a fourth support assemblyembodiment.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

It is desirable that zero-heat-flux, deep tissue temperature probe (DTTprobe) constructions be disposable. Thus the constructions should beeasy and inexpensive to fabricate and assemble, have a low mass and alow profile, and comprise inexpensive materials and parts.

It is particularly desirable that disposable DTT constructions beassembled from low-profile, light weight, flexible assemblies thatenable zero-heat-flux measurement at various locations on a human oranimal body.

A thermal measurement support assembly for zero-heat-flux deep tissuetemperature probe (DTT probe) constructions includes a flexiblesubstrate with at least two thermal sensors disposed in a spaced-apartrelationship and separated by one or more layers of thermally insulatingmaterial. Preferably the sensors are spaced apart vertically as in FIGS.1 and 2, and they may further be spaced apart horizontally or radiallywith respect to a center of measurement of vertical heat flux. Thesubstrate supports at least the thermal sensors and the separatingthermal insulating material, and it may also support one or moreheaters. Once constructed, the support assembly is ready to beincorporated into the structure of a DTT probe.

A first embodiment of a support assembly for a DTT probe is illustratedin FIG. 3. The support assembly 200 includes a permanent heater (notshown) with an attachment mechanism (not shown) and is designed andmanufactured to be disposable. The support assembly 200 includes a filmof material coated with copper on both sides and fashioned into twodisk-shaped sections 202 and 204 that are joined at a common peripherallocation 206 disposed between the two sections. The disk shaped sections202 and 204 include major supporting surfaces 203 and 205 respectively.The surfaces on the opposite sides of the major supporting surfaces 203,205 (which are not seen in these figures) support respectivethermocouples whose junctions 207, 209 are visible at the respectivecenters of the major supporting surfaces 203, 205. Signal leads 211, 213are connected to the thermocouples at the junctions 207, 209, and acommon lead 215 is electrically coupled to the thermocouples.Preferably, a pressure-sensitive adhesive (PSA)-backed, 0.001 inch thickpiece of insulative material such as a polyimide layer (Kapton® film,for example) is disposed on one of the surfaces on the opposite side ofone of the major supporting surfaces 203, 205, and the support assemblymay be folded like a clam shell, on a crease at the common peripherallocation 206, as shown in FIGS. 4 and 5. An insulating material withgreater thermal resistance may also be interposed between the surfaces203 and 205 to decrease the sensitivity of the support assembly. Whenthe support assembly is so folded, the thermocouples are disposed in astacked configuration, with the layer of insulative material disposedtherebetween to provide thermal resistance. The copper disks areelectrically continuous; therefore, the junction of each thermocouple iscommon to both disks, which makes it possible to eliminate one wire fromthe pair of thermocouples. Although the probe is designed to minimizeradial heat losses and radial temperature differences, the placement ofthe thermocouples in the center of the copper disks minimizes fineffects that tend to reduce accuracy.

The thermocouples in the first support assembly embodiment illustratedin FIGS. 3-5 may be assembled with other elements of a DTT probeillustrated in FIG. 1, but the heater assembly is likely to becomecontaminated after use, and a disposable ZHF probe design is verydesirable to avoid cross contamination between patients.

With reference to FIGS. 6-9, a second embodiment of a support assembly500 for a DTT probe includes a heater integrated into the supportassembly. There are no wires attached to this embodiment as both signaland power leads are available on a connector tab on the circumference ofthe assembly.

As best seen in FIGS. 6 and 7, the support assembly 500 includes aflexible substrate, preferably a sheet of flexible, thermally insulativematerial that is formed to include a plurality of contiguous sections.For example three contiguous paddle-shaped sections with disks 502, 504,and 506 of equal diameter are formed and aligned so that their centerslie on a straight line. Each disk transitions to a tab for supportingone or more electrical leads. The tabs are indicated by referencenumerals 503, 505, and 507, respectively. The inner periphery of eachdisk is continuous with each adjacent inner periphery at a point that istangent to the perimeter of the inner circle and which intersects theline upon which the centers are aligned. Thus, the inner periphery ofthe outer disk 502 is continuous with the periphery of the inner disk504 at 509, and the inner periphery of the outer disk 506 is continuouswith the periphery of the inner disk 504 at 511, which is diametricallyopposite 509 on the periphery of the inner disk 504. Each disk has twoopposite-facing, disk-shaped major surfaces. Thus, the outer disk 502has major surfaces A and B, the inner disk 504 has major surfaces C andD, and the outer 506 has surfaces E and F. The major surfaces A, D, andE are on one side of the support assembly 500; the major surfaces B, C,and F are on the opposite side.

As seen in FIGS. 6 and 7, a heater 514 is formed on the major surface Aby, for example, depositing a layer of copper on the surface and thenetching the copper layer. The etching includes formation of leads 512for the heater on the tab 503 that terminate in pins 513 at the outeredge of the tab 503. The etching also exposes a ring 510 of insulativematerial at the periphery of the major surface A. The layer 515 ofcopper on major surface C is etched to expose a ring 516 of insulativematerial at the periphery of the surface. The disk 517 of copper filminside the ring 516 is used as one element of a thermocouple 518. Forexample, the thermocouple 518 is fabricated by soldering, brazing, orwelding one end of an insulated chromel wire 519 to the disk 517 ofcopper film, preferably, but not necessarily, at or near the center ofthe surface C. The other end of the chromel wire 519 is soldered,brazed, or welded to a chromel pin 520 mounted to the tab 505. Etchingthe copper on the major surface C also forms a lead 521 and a pin 522for the copper portion of the thermocouple 518 on the tab 505. Anotherthermocouple 525 is similarly fabricated on the major surface E. Etchingremoves copper from the major surfaces B, D, and F so that thosesurfaces have no copper thereon.

With the heater 514 and thermocouples 518 and 525 thus formed, thesupport assembly 500 may be Z-folded as shown in FIG. 8. Preferably, thesections 502 and 504 are folded at 509 by swinging the major surfaces Band C together and the sections 504 and 506 are folded at 511 byswinging the major surfaces D and E together. The folded supportassembly 500 is seen in the top plan view of FIG. 9. In this aspect, thesupport assembly 500 is preferably oriented with respect to a locationon a body where a deep tissue temperature reading is to be taken bydenominating the heater 514 as the top of the assembly, and majorsurface F as the bottom. In this aspect, the tabs 503, 505, and 507 arealigned by the folding place so as to align all of the leads and pins ona single side of a composite tab 520. Preferably, but not necessarily,the composite tab 520 is oriented with the aligned pins facing in thesame direction as the heater on major surface A. The table in FIG. 9sets forth the pin assignments. In the table, the lower thermocouple ison major surface E and the upper thermocouple is on major surface C. Theconnectors on the composite tab 520 provide electrical access to each ofthe thermal sensors and to the heater. A compression connector (notseen) may be received on the composite tab 520.

Final assembly of a DTT probe construction with a support assembly 500according to the second embodiment is illustrated in FIG. 10. In theunfolded assembly, there are three circular disks and six surfaceregions. Layers formed by folding the support assembly are labeled asshown in the figures. The layers are, as follows:

Major surface A is the electric heater

Major surface B is plastic film

Major surface C is a copper layer that supports a thermal sensor

Major surface D is a plastic film

Major surface E is a copper layer that supports a thermal sensor

Major surface F is plastic film

The assembled DTT probe may include additional layers added to thestructure of the probe during assembly. For example, layers ofpressure-sensitive adhesive (PSA) 527 may be disposed between the foldedsections and on the top and bottom major surfaces, an insulating layermay be disposed on the layer of PSA above the heater, and a furtherlayer of PSA may be disposed on the top of the insulating layer.Further, a release liner may be provided on the bottom PSA layer, and analuminum radiation shield may be supported on the top PSA layer. Theexemplary embodiment of the DTT probe shown in FIG. 10, with the secondsupport assembly embodiment, includes sixteen separate layers. Thematerials and constructions described for the support assembly andrepresentative dimensions for the layers which are shown in Table Ibelow illustrate the achievement of a disposable DTT probe with a verylow vertical profile, an inexpensive construction, and a flexiblestructure that can adapt to differing contours of various measurementlocations on the body of a person.

TABLE I Layer Thickness (in.) (est.) Aluminum foil radiation shield0.001 Pressure-sensitive adhesive 0.0005 Insulating foam 0.010Pressure-sensitive adhesive 0.0005 Heater - Surface A 0.001 Plasticfilm - Surface B 0.002* Pressure-sensitive adhesive 0.0005 UpperThermocouple 0.0005 Metal foil (copper) - Surface C 0.001 Plastic film-Surface D 0.002* Pressure-sensitive adhesive 0.0005 Lower thermocouple0.0005 Metal Foil (copper) - Surface E 0.001 Plastic film - Surface F0.002* Pressure-sensitive adhesive 0.0005 Release liner 0.001 TOTAL0.0235 *This dimension is the thickness of the substrate, which may varywith the design goals of the DTT probe.

The second support assembly embodiment illustrated in FIGS. 6-10 may beassembled with other elements of a DTT probe system, as illustrated inFIG. 1.

FIGS. 11A, 11B, 12A, and 12B illustrate third and fourth supportassembly embodiments. Each of the third and fourth embodiments ischaracterized by a structure with a single substrate layer formed into aplurality of contiguous sections that are separated into strata on whichthe thermal sensors are disposed in a spaced-apart relationship.Preferably, the thermal sensors are disposed on two contiguous elongatesupport members, disposed in a spaced-apart, an opposing or an adjacentrelationship, inwardly of the periphery of the support assembly.Preferably, the substrate has the shape of an annulus with acircumferential heater disposed thereon and the two sensor supportmembers projecting inwardly thereof and separated by a thermallyinsulating layer separate from the substrate. It is desirable to providea lead support tab projecting outwardly of the annulus and supportingleads for the heater and the thermal sensors.

In FIGS. 11A and 11B, a two-sided, planar sheet 601 of flexiblesubstrate material is provided and one side of the sheet is coated witha layer of conductive metal such as copper. The copper sheet is etchedto form a heater 602, thermocouple traces, leads, and pins. Chromeltraces, leads, and pins are deposited on the substrate, and a singlepaddle-shaped section with a disk 600 is formed by cutting, stamping ormachining the planar sheet. The disk 600 transitions to a tab 603 forsupporting the copper and chromel leads and pins. The heater 605 isdefined along the circular circumference of the disk 600 by a conductivetrace having a triangle wave shape. The heater 605 surrounds thethermocouple junctions 607 and 608. The thermocouple junctions 607 and608 are aligned with respect to a diameter of the disk 600 and disposedon either side of its center. The inner section 606 of the substrate isdie cut and removed leaving the heater 605 supported on an annulus ofsubstrate material and the thermocouple junctions 607 and 608 disposedon two thermal sensor support tabs 611 and 613 that project inwardly ofthe annulus, in an opposing relationship. The two tabs 611 and 613 arethen separated into strata and a film or layer 615 of thermallyinsulating material that is separate from the substrate is interposedtherebetween, which produces a vertical separation, and inserts athermal resistance, between the thermocouples. Assignments of the pinsin FIG. 11A are given in Table II.

TABLE II PIN DESCRIPTION 1 HEATER 2 THERMOCOUPLE 607 3 THERMOCOUPLE 6074 THERMOCOUPLE 609 5 THERMOCOUPLE 609 6 HEATER

FIGS. 12A and 12B illustrate a fourth support assembly embodimentsimilar to the single-layer probe structure of the third embodiment seenin FIGS. 11A and 11B, but with elongated, oppositely-directed thermalsensor support tabs 711 and 713 offset in an adjacent relationship onrespective sides of the diameter on which the tabs 611 and 613 arealigned. This arrangement allows a thicker layer 715 of thermallyinsulating material to be placed between the tabs. Thicker insulationdecreases the sensitivity of the probe and increases the amplitude ofthe error signal. This is an advantage because it makes it easier tooperate a control algorithm when zero-heat-flux conditions prevail. Thedisadvantage is that increased thermal resistance increasesequilibration time. The pin assignments for the fourth embodimentcorrespond essentially to those of the third.

The two embodiments of FIGS. 11A, 11B, 12A, and 12B are for a sensorassembly. A DTT probe with either embodiment may be assembled into aconstruction with fewer layers than that disclosed in FIG. 10. Theexpected advantages of these embodiments are 1) ease of construction, 2)minimization of radial temperature differences, 3) minimization ofmaterials, and 4) because each embodiment is based on a single layer, nofolding of the substrate is required during assembly or operation,although steps of tab separation and insertion of a thermally insulatinglayer are necessary. Each of these designs is intended to be disposable;each is designed to use circumferential heating as opposed to fulldiametric heating.

A support assembly according to any of the four embodiments may beconstructed using a substrate constituted of a single double-sided sheetof plastic film such as Kapton® polyimide, Kaptrex® polyimide, polyesteror another film of flexible, thermally insulating material. The sheetmay be coated on one or both sides with a copper film and variouselements such as heaters, copper disks, and copper leads and pins may bemade by photo-etching before the support assembly is folded orseparated. The sheet may then be die-cut to the required shape andfolded or separated as described above. Other metals with high thermalconductivities, like gold or aluminum, may also be used, although copperis preferred because it can form one half of a T-type thermocouple;however, other types of thermocouples are possible, and it may bepossible to dispense with metal films altogether if other thermalsensors such as balanced RTD's, thermistors, and/or point junctionthermocouples are used to measure temperature. Chromel traces and leadsmay be formed by deposition, or by peening.

A disposable DTT probe may be easily and inexpensively made using thesupport assembly construction embodiments described above. Disposabilitymakes the commercialization of a DTT probe possible. Also, a single-useprobe limits the potential for cross-contamination and makes it possiblefor more patients to benefit from perioperative temperature monitoring.

Thus, although the invention has been described with reference to thepresently preferred embodiment, it should be understood that variousmodifications can be made without departing from the spirit of theinvention. Accordingly, the invention is limited only by the followingclaims.

1. A zero-heat-flux temperature probe comprising: a two-sided substrate;a heater disposed on the substrate; a plurality of sections defined inthe substrate, in which each section is joined to at least one adjacentsection at a common peripheral location; two thermal sensors, each ofthe two thermal sensors supported on a respective one of two adjacentsections; the two adjacent sections folded together at a commonperipheral location joining the two sections, wherein the folded twoadjacent sections are in a stack configuration; and a lead support tabprojecting outwardly of a periphery of one of the plurality of sectionsand leads on the lead support tab for the heater and the thermalsensors, wherein one of the plurality of sections has a generally roundshape with the heater disposed thereon.
 2. The zero-heat-fluxtemperature probe of claim 1, wherein the plurality of sections are thetwo adjacent sections, each of the two thermal sensors is mounted on amajor support surface of a respective one of the two sections, and thesections are folded together in clam shell fashion such that the twothermal sensors face each other.
 3. The zero-heat-flux temperature probeof claim 1, wherein the plurality of sections are three sections, eachsection has opposing major support surfaces, a first thermal sensor ismounted on a first major support surface of a first section of the twoadjacent sections, the second thermal sensor is mounted on a secondmajor support surface of the second section of the two adjacentsections, and the three sections are folded together such that the twothermal sensors face in the same direction.
 4. The zero-heat-fluxtemperature probe of claim 3, wherein the heater is positioned tosandwich one of the two adjacent sections between the heater and theother of the two adjacent sections.
 5. The zero-heat-flux temperatureprobe of claim 4, wherein the heater is supported on a major supportsurface of the third section.
 6. A zero-heat-flux temperature probecomprising: a sheet of flexible material with two sides; a heaterdisposed on the sheet of flexible material; two or more sections definedin the sheet; two of the two or more sections joined at a peripherallocation; two thermal sensors, each of the two thermal sensors supportedon a respective one of the two or more sections; the two of the two ormore sections folded together, wherein the folded two sections are in astack configuration; and a lead support tab projecting outwardly of aperiphery of the sheet of flexible material and leads on the leadsupport tab for the heater and the thermal sensors, wherein one of thetwo or more sections has a generally round shape with the heaterdisposed thereon.
 7. The zero-heat-flux temperature probe of claim 6,wherein each of the thermal sensors is a thermocouple.
 8. Thezero-heat-flux temperature probe of claim 7, wherein the two sectionsare folded together in clam shell fashion such that the thermal sensorsare disposed in a stacked configuration.
 9. The zero-heat-fluxtemperature probe of claim 7, wherein each thermocouple includes acopper disk supported on a surface of a respective section and a chromelwire, wherein the copper disk is attached to the chromel wire at athermocouple junction.
 10. The zero-heat-flux temperature probe of claim6, wherein the sheet is a flexible sheet of thermally insulatingmaterial.
 11. The zero-heat-flux temperature probe of claim 10, whereinthe sheet is coated with a copper film on each side.
 12. Thezero-heat-flux temperature probe of claim 11, wherein each copper filmis etched to form an element of a respective one of the thermal sensors.13. The zero-heat-flux temperature probe of claim 11, wherein one copperfilm is etched to form the heater.
 14. A zero-heat-flux temperatureprobe comprising: a substrate having a center; a heater disposed on aperiphery of the substrate; two support sections extending from theperiphery of the substrate toward the center and disposed within theperiphery; two thermal sensors, each of the two thermal sensorssupported on a respective one of the support sections; and, a thermalresistor disposed between and separating the two support sections intostrata.
 15. The zero-heat-flux temperature probe of claim 14, in whichthe substrate has a circumferential periphery and the two supportsections are disposed in an opposing or an adjacent relationship,inwardly of the periphery.
 16. The zero-heat-flux temperature probe ofclaim 15, in which the substrate has the shape of an annulus with theheater disposed thereon and the two support sections project inwardly ofthe annulus.
 17. The zero-heat-flux temperature probe of claim 15,further comprising a lead support tab projecting outwardly of thecircumferential periphery and leads on the lead support tab for theheater and the thermal sensors.
 18. The zero-heat-flux temperature probeof claim 15, in which the thermal sensors are thermocouples.